Advanced Processing and Characterization Technologies

Advanced Processing and Characterization Technologies

4.11 - 1251 ratings - Source

Effect of Window Diffusion Stripe Structure on Reduction of Temperature Rise at Laser Facet Aklhlro Shlma, Yoshihiro Kokubo and Masao Alga Optoelectronic aamp; Microwave Devices Raamp;D Laboratory Mitsubishi Electric Corporation 4-1, Mizuhara, Itami Hyogo, 664 Japan 1. Introduction Recently ... Figure 1 shows a schematic diagram of the system for the measurement of the temperature at the laser mirror.

Title:Advanced Processing and Characterization Technologies
Author: Paul H. Holloway
Publisher:Amer Inst of Physics - 1991

You must register with us as either a Registered User before you can Download this Book. You'll be greeted by a simple sign-up page.

Once you have finished the sign-up process, you will be redirected to your download Book page.

How it works:
  • 1. Register a free 1 month Trial Account.
  • 2. Download as many books as you like (Personal use)
  • 3. Cancel the membership at any time if not satisfied.

Click button below to register and download Ebook
Privacy Policy | Contact | DMCA