VLSI Testing
This book is a self-contained introduction to all aspects of microelectronic (IC) testing. It includes the theory necessary for advanced students as well as reference to industrial practice and economics that will interest designers in industry. Chapters cover both digital circuit testing and the growing area of mixed circuits, used particularly in signal processing.A different problem can arise with a fault in the series connection of the n- channel FETs in Figure 2.8o. Here an open-circuit fault in either transistor will prevent the gate output from being discharged to 0 V, but a short circuit on a transistor cananbsp;...
| Title | : | VLSI Testing |
| Author | : | Stanley Leonard Hurst |
| Publisher | : | IET - 1998 |
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